'The analysis of layered paint samples from modern paintings using FTIR microscopy’

Aviva Burnstock, A. Langley

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication12th Triennial meeting of ICOM-CC
Place of PublicationLondon
PublisherJames & James
Pages 234-241
Publication statusPublished - 1999

Cite this

Burnstock, A., & Langley, A. (1999). 'The analysis of layered paint samples from modern paintings using FTIR microscopy’. In 12th Triennial meeting of ICOM-CC (pp. 234-241). London: James & James.

'The analysis of layered paint samples from modern paintings using FTIR microscopy’. / Burnstock, Aviva; Langley, A.

12th Triennial meeting of ICOM-CC. London : James & James, 1999. p. 234-241.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Burnstock, A & Langley, A 1999, 'The analysis of layered paint samples from modern paintings using FTIR microscopy’. in 12th Triennial meeting of ICOM-CC. James & James, London, pp. 234-241.
Burnstock A, Langley A. 'The analysis of layered paint samples from modern paintings using FTIR microscopy’. In 12th Triennial meeting of ICOM-CC. London: James & James. 1999. p. 234-241
Burnstock, Aviva ; Langley, A. / 'The analysis of layered paint samples from modern paintings using FTIR microscopy’. 12th Triennial meeting of ICOM-CC. London : James & James, 1999. pp. 234-241
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